SALANG SLX-1000 SERIES
Organize bio-fluorescence, metallography, professional polarization, infrared, Raman and 3D measurement tasks on the same scalable microscopy platform. Select the measuring head, objective, illumination and analysis module around the sample and task, then move from routine observation to professional analysis in one workflow.
01 / Product Positioning
The SLX-1000 Series is an integrated microscopy platform built around modular measurement heads, an infinity-corrected optical system and unified analysis software. The system can be configured for bio-fluorescence, metallography, professional polarization and 3D measurement, with infrared, Raman and other observation capabilities added according to actual tasks.
For laboratories, R&D departments and quality centers that handle multiple samples and analysis tasks, users do not need separate hosts for each observation method. Samples can complete overview positioning, mode switching, local observation, dimensional measurement and analysis-result recording on the same platform, reducing time and data differences caused by sample transfer, repeated clamping and repositioning.
SLX uses a unified host, precision stage, imaging software and analysis workflow, then supports bio-fluorescence, metallography, professional polarization and other observation directions through different measuring heads, objectives and illumination modules. Users do not need to build a separate equipment and operation process for every task.
Depending on the measuring head, objective and illumination configuration, the system can observe through brightfield, darkfield, phase contrast, differential interference contrast (DIC), polarization, fluorescence and infrared modes. Each mode enhances different information, such as surface morphology, edges, tissue, fluorescence signals, material orientation or internal structure, helping users understand the same sample from different angles.
For samples beyond a single field of view, the system can build a sample overview through multi-field acquisition and let users select the location that needs further observation from the overview map. Users can move from low-magnification positioning to high-magnification local analysis, keeping large-area archiving, area review and multi-mode observation continuous.
After microscopic observation, users can continue with 2D measurements such as length, distance, angle and area, then perform 3D morphology, surface-structure or professional analysis according to the selected measuring head and system configuration. Images, annotations, measurement results and analysis records can be saved and exported in the same software process.
In addition to the three main measuring-head directions, the SLX platform can be configured with infrared microscopy, Raman microscopy and other professional optical or analytical modules according to project needs. Capabilities are combined around tasks, so users do not need to configure every function at the start, and optional capabilities are not presented as default standard configurations.
A single observation method often reveals only part of a sample's characteristics. Depending on the measuring head and configuration, SLX can switch between brightfield, darkfield, DIC, polarized light, fluorescence and infrared observation so surface morphology, edges, tissue, fluorescence signals and internal structures can be presented more clearly.
The system can stitch multiple microscopic fields of view into a complete sample overview while retaining local position relationships. Users can first archive a large-area overview, then select the target area and return to higher magnification or another observation mode for review.
After microscopic observation, users can continue with 2D dimensional measurement and professional analysis of 3D morphology, metallographic structures, particles, materials or micro-areas based on the measuring head and analysis module. Different results are organized in the same software process for review, comparison and report output.
SLX is based on a unified microscopy platform. It establishes bio-fluorescence, metallographic analysis and professional polarization directions through three main measuring-head types, then adds infrared, Raman and other professional capabilities according to project needs. Users can plan around current tasks and later expansion, reducing unnecessary investment in equipment and functions.
The SLX model is determined by the measuring head and main observation direction. Users first select bio-fluorescence, metallographic analysis or professional polarization according to the core sample and task, then evaluate whether to add infrared, Raman or other professional measuring heads and functional modules.
For fluorescence, biological and multimodal sample observation.
SLX-1000 uses bio-fluorescence observation and 3D measurement as its primary direction, and suits tasks that require brightfield, fluorescence and related biological sample observation. Users can complete sample positioning, fluorescence signal observation, dimensional measurement and 3D morphology-assisted analysis on the same platform, with infrared microscopy expansion evaluated according to project needs.
Bio-fluorescence · multimodal observation · 3D measurement
For metal structures, material surfaces and industrial analysis.
SLX-1100 uses metallographic observation, industrial microscopic analysis and 3D measurement as its primary direction, and suits grains, inclusions, coatings, fractures, machined surfaces and material structures. The system can organize observation around brightfield, darkfield, DIC and related modes, with Raman microscopy or other professional analysis capabilities expanded according to project needs.
Metallographic structure · industrial observation · 3D measurement
For crystals, fibers and anisotropic materials.
SLX-1200 uses professional polarized-light observation and 3D measurement as its primary direction, and suits crystals, minerals, fibers, films and materials with orientation or stress characteristics. Polarization-related configuration enhances the visibility of material structure, orientation and difference areas while supporting dimensional and 3D morphology-assisted analysis.
Professional polarized light · material orientation · 3D measurement
Infrared microscopy, Raman microscopy and other professional modules can be added according to project needs. Standard / professional configuration, measuring head compatibility and final combination are subject to the sample task and formal configuration plan.
The following content explains the main measuring-head directions and shared platform capabilities of SLX-1000, SLX-1100 and SLX-1200. Specific objectives, illumination, cameras, measurement ranges and professional extension parameters are subject to the official brochure and project configuration.
| Configuration Item | SLX-1000 | SLX-1100 | SLX-1200 |
|---|---|---|---|
| Main direction | Bio-fluorescence and 3D measurement | Metallographic analysis and 3D measurement | Professional polarization and 3D measurement |
| Typical Samples | Fluorescent samples, biological samples and transparent samples | Metals, coatings, fractures and material structures | Crystals, fibers, minerals, films and anisotropic materials |
| Main Observation Focus | Fluorescence signals and multimode microscopic observation | Metallographic structures and industrial surface analysis | Material orientation, structural differences and polarization features |
| 3D measurement | Supported by the main measurement heads; exact capability depends on configuration | ||
| Large field of view splicing | Supports sample overview and local review according to system configuration | ||
| 2D measurement and result output | Shared capability of the series platform | ||
| Professional extensions | Infrared, Raman and other professional measuring heads / function modules are project options | ||
Multi-mode observation of wafer, chip, MEMS, package structure, solder joints, foreign objects and failure locations; carry out infrared internal observation and size and morphology analysis according to the configuration.
Observation and analysis of metallographic structure, grains, inclusions, fractures, coatings, corrosion, composite materials and surface structures.
Brightfield, fluorescence and correlation mode observation of fluorescent samples, cells, tissue sections, transparent samples and biological structures.
Crystals, minerals, fibers, films, stress-related materials, as well as professional micro-area observation and analysis of Raman, infrared, etc. according to configuration.
Submit the sample type, main observation method, analysis goals and subsequent expansion needs, and the engineer will help determine a more suitable measurement head direction, objective lens, lighting and professional module combination.